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A 1.2 V 2.64 GS/s 8bit 39 mW skew-tolerant time-interleaved SAR ADC in 40 nm digital LP CMOS for 60 GHz WLAN

机译:用于60 GHz WLAN的40 nm数字LP CMOS中的1.2 V 2.64 GS / s 8位39 mW耐斜度时间交错SAR ADC

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A clock-skew tolerant 8-bit 16x time-interleaved (TI) SAR ADC is presented that meets WiGig standard requirements with only background offset and gain calibrations. By using a “correct-by-construction”, timing-calibration-free global bottom-plate sampling scheme, the ADC achieves a sampling rate of 2.64GS/s while maintaining an ENOB of over 6 bits in the entire Nyquist band. The 40nm LP CMOS design dissipates 39mW from 1.2V. The TI-SAR ADC characterized with an integrated receiver front-end achieves −21.44dB EVM at sensitivity with an OFDM/ QAM16 signal.
机译:提出了一种具有时钟偏斜容限的8位16x时间交错(TI)SAR ADC,仅通过背景偏移和增益校准即可满足WiGig标准要求。通过使用“无构造校正”,无时序校准的全局底板采样方案,ADC可以实现2.64GS / s的采样率,同时在整个奈奎斯特频带内保持ENOB超过6位。 40nm LP CMOS设计的1.2V功耗为39mW。具有集成接收器前端的TI-SAR ADC在具有OFDM / QAM16信号的灵敏度下可实现−21.44dB EVM。

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