Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL

摘要

HTOL study on Display Driver IC (DDI) using 70nm process technology node is presented in this work. DDI is an IC that controls the display color pixels. The Average Voltage Output (AVO) and Deviation Voltage Output (DVO) are the two critical parameters for reliability that determines the quality of display. We report the fails observed in early product HTOL testing due to Vt mismatch of transistors in the amplifier design after aging and fixes implemented to significantly improve product reliability.