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Very fine refractive index tuning of silicon by single femtosecond laser pulses below melting threshold

机译:通过单一飞秒激光脉冲低于熔化阈值的单一飞秒激光脉冲非常精细的折射率调整

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摘要

We report measurements of very small refractive index changes in crystalline silicon by fs laser irradiation below melting threshold. Our measured threshold for permanent optical change is up to five times lower than previously reported.
机译:通过FS激光照射低于熔化阈值,我们报告了晶体硅的非常小的折射率变化的测量。我们的永久光学变化的测量阈值高于先前报告的5倍。

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