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Temperature controlled measurement system for precise characterization of electronic circuits and devices

机译:温控测量系统,用于精确表征电子电路和装置

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A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart & Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375K (around 102 °C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2mK.
机译:设计并建造了一种温度控制的烤箱,具有用于轻松连接仪器的仪器的规定,并设计并构建。本文介绍了烤箱,其热模型和控制系统,并呈现测量结果,具有不同的温度型材。 NTC热敏电阻测量系统温度和改进的Steinhart&Hart方程用于将电阻读数转换为温度。该系统能够将其温度从刚刚过于375k(约102°C约为102°C)。温度稳定性最终受到温度测量的分辨率至±2MK的限制。

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