首页> 外文会议>IEEE CPMT Symposium Japan >A Study of Adhesion Interface about Die Bonding Structure with Conductive Silver Paste
【24h】

A Study of Adhesion Interface about Die Bonding Structure with Conductive Silver Paste

机译:导电银浆料粘合界面的粘合界面研究

获取原文

摘要

In the electronic packages, gold surfaces are useful for stable connections. In this paper, adhesion interface for die bonding structure with conductive silver paste is investigated. The adhesive interface between gold surface and epoxy resin is investigated in two approaches. The first-principles calculations are employed to optimize the structure and calculate the theoretical bonding strength. The fragment model is constructed for bisphenol-A type epoxy resin and a curing agent which includes dicyandiamide. The results show that a cyano group included in the hardener greatly interacts with ideal gold surface, whereas a hydroxyl group seems not to interact with them regardless of high polarity. This interaction is likely to come from the π-back donation. The predicted bonding strength is as high as 1.15GPa. Next, the actual die pad surfaces prepared with plating gold are characterized to presume the substantial bonding structure by analytical method. Besides, measurements of adhesive strength have been performed by using small size lap shear tests under various temperatures. These results show that there are altered layers at the top of plating gold, which seems to affect the interaction mechanisms to hydrogen bond and make the adhesive strength lower.
机译:在电子封装中,金表面可用于稳定连接。本文研究了具有导电银浆料的模具粘合结构的粘附界面。在两种方法中研究了金表面和环氧树脂之间的粘合剂界面。采用第一原理计算来优化结构并计算理论粘合强度。片段模型用于双酚-A型环氧树脂和包括双氰胺的固化剂。结果表明,固化剂中包含的氰基与理想的金表面相互作用,而羟基似乎不与它们相互作用,而不管高极性如何。这种互动可能来自π-返回捐赠。预测的粘合强度高达1.15gPa。接下来,用电镀金制备的实际模垫表面的特征在于通过分析方法假设基本的粘合结构。此外,通过在各种温度下使用小尺寸的膝盖剪切试验进行了粘合强度的测量。这些结果表明,电镀金顶部有改变的层,似乎影响了氢键的相互作用机制,使粘合强度降低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号