首页> 外文会议>IEEE International Conference on Imaging Systems and Techniques >An inverse scattering approach for inspecting dielectric scatterers at microwave frequencies without phase information
【24h】

An inverse scattering approach for inspecting dielectric scatterers at microwave frequencies without phase information

机译:一种无需相位信息即可在微波频率下检查介电散射体的逆散射方法

获取原文

摘要

Microwave imaging techniques aim at inspecting targets by using interrogating microwaves. In recent years, several numerical inversion methods and prototypes of microwave imaging systems have been developed. In most cases, they consider an illuminating apparatus and one or more probes used to measure the field scattered by the target; usually, the values of the amplitudes and phases of the field samples are needed. In this work, a hybrid approach for phaseless imaging of dielectric targets is proposed. A two-probe measurement strategy with the related phase-retrieval method is adopted in conjunction with an inversion procedure based on an inexact-Newton method to give an efficient and low-cost imaging setup. Preliminary numerical and experimental validations are discussed.
机译:微波成像技术旨在通过使用询问微波检查目标。近年来,已经开发了几种数控反演方法和微波成像系统的原型。在大多数情况下,他们考虑一个照明设备和一个或多个用于测量目标散射的场的探针;通常,需要诸如现场样本的幅度和阶段的值。在这项工作中,提出了一种用于挖掘成像的介电靶的释放成像的混合方法。使用基于INExact-Newton方法的反转过程采用具有相关相位检索方法的双探针测量策略,以提供高效且低成本的成像设置。讨论了初步数值和实验验证。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号