首页> 外文会议>IEEE MTT-S International Microwave Symposium >SAW substrate for Duplexer with Excellent Temperature Characteristics and Large Reflection Coefficient realized by using Flattened SiO{sub}2 Film and Thick Heavy Metal Film
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SAW substrate for Duplexer with Excellent Temperature Characteristics and Large Reflection Coefficient realized by using Flattened SiO{sub}2 Film and Thick Heavy Metal Film

机译:用于双工器的锯基板具有优异的温度特性和使用扁平SiO {Sub} 2膜和厚重金属膜实现的大反射系数

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Authors previously proposed a SAWPCS-duplexer with an excellent temperature coefficient of frequency (TCF) and a good frequency characteristic composed of a thick-SiO{sub}2/thin-Au-electrodes/LiTaO{sub}3 structure. However a sheet resistance of thin Au electrode is large, compared with thick Al-electrode, so thin Au-electrode is not suitable for filters requiring low loss. Authors tried to use thick Cu electrodes with small resistance By flattening large convex portions on the SiO{sub}2 surface, a SAW substrate suitable for US-PCS duplexer with low insertion loss and an excellent TCF was realized.
机译:作者以前提出了具有优异温度频率(TCF)温度系数(TCF)的SAWPCS双工器,以及由厚SIO {SUB} 2 /薄AU-电极/ LIAO {SUB} 3结构组成的良好频率特性。然而,与厚的Al电极相比,薄Au电极的薄层电阻大,因此薄的Au-电极不适用于需要低损耗的过滤器。作者试图通过在SiO {Sub} 2表面上平坦化的大凸部使用具有小阻力的厚Cu电极,实现适用于具有低插入损耗的US-PCS双工器和优异TCF的锯基板。

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