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CICADA: A New Tool to Design Circuits with Correction and Detection Abilities

机译:蝉:一种用校正和检测能力设计电路的新工具

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In view of rapid development of microelectronic industry, there is a growing need to ensure reliability and fault tolerance of combinational devices exposed to various destabilizing effects. To solve this problem, methods based on synthesis of concurrent error detection (CED) circuits are now increasingly used, which enable, at the expense of some structural redundancy, correcting and/or detecting errors arising in the circuit. For each specific circuit, depending on the chosen synthesis method, CED circuits have different reliability characteristics, which makes it difficult for designers to choose one or another architecture. Therefore, there is a need to increase automation level of the process of selecting a method for control circuit synthesis, depending on the initial parameters of the protected device. This work is devoted to development of methods and software for detecting the best method for synthesizing a control circuit, taking into account the user-introduced constraint on structural redundancy of the resulting circuit.
机译:鉴于微电子行业的快速发展,越来越需要确保暴露于各种稳定效果的组合装置的可靠性和容错能力。为了解决这个问题,现在越来越多地使用基于并发错误检测(CED)电路的方法的方法,这使得能够以牺牲在电路中产生的一些结构冗余,校正和/或检测误差来实现。对于每个特定电路,根据所选择的合成方法,CED电路具有不同的可靠性特性,这使得设计人员难以选择一个或另一个架构。因此,需要提高选择控制电路合成方法的过程的自动化级别,这取决于受保护设备的初始参数。这项工作致力于开发用于检测合成控制电路的最佳方法的方法和软件,考虑到用户引入了所得电路的结构冗余的限制。

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