Failure analysis of integrated detector dewar cryocooler assembly

摘要

The Integrated Detector Dewar Cryocooler Assembly (IDDCA) is a critical component for advanced infrared systems, and especially in infrared (IR) applications, a high reliability for the IDDCA is required increasingly. In this paper, we systematically analyze the failure modes of IDDCA, such as interconnect failure, diodes degradation, vacuum failure, spring fracture, leakage of working medium, mechanical wear and contamination based on their reliability physics. Generally, thermal cycles, outgassing, process defects, are the major causes of these failures. This paper would be helpful for improving the level in the design and manufacture of IDDCA.