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Frontside laser fault injection on cryptosystems - Application to the AES' last round -

机译:密码系统上的前端激光故障注入-在AES的上一轮中的应用-

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Laser fault injection through the front side (and consequently the metal-flls) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the properties of fault injection with a larger laser beam (in the 100/im range). We have also checked whether the bit-set (or bit-reset) fault type still holds or whether the bit-fip fault type may be encountered. Laser injection experiments were performed during the last round of the Advanced Encryption Standard (AES) algorithm running on an ASIC. The gathered data allowed to investigate the obtained fault models, to conduct two usual Differencial Fault Attack (DFA) schemes and to propose a simple version of a third DFA.
机译:通过前侧(以及因此IC的电侧的激光故障注入IC的介质或小激光束通常用于注射Bytewise断层。我们在本文中调查了具有较大激光束的故障注射的性能(在100 / IM范围内)。我们还检查了位设置(或位重置)故障类型仍然保持还是可能遇到位FIP故障类型。在ASIC上运行的先进加密标准(AES)算法的最后一轮上一轮进行激光注射实验。收集的数据允许调查所获得的故障模型,进行两种通常的差异故障攻击(DFA)方案,并提出一个简单的第三个DFA版本。

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