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Set-sweep programming pulse for phase-change memories

机译:用于相位变更存储器的SET-SWEEP编程脉冲

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This paper presents a non-conventional program pulse approach for phase-change memories (PCMs). The cell programming curve is experimentally evaluated and discussed. The proposed set-sweep program pulse allows compensating for spreads in cell physical parameters. This ensures a better SET condition for marginal cells and adequately narrow SET distributions, which results in improved read margin. Experimental results have been collected from a 8-Mb BJT-selected PCM demonstrator. The effectiveness of the proposed program pulse has been proved by comparing cell distributions obtained on the whole array by means of a conventional SET box and a set-sweep program pulse, respectively.
机译:本文提出了一种用于相变存储器(PCM)的非传统程序脉冲方法。通过实验评估和讨论细胞编程曲线。所提出的SECE-SWEEP程序脉冲允许补偿细胞物理参数中的差异。这确保了更好的边缘电池和充分窄的集合分布的更好的态度,这导致改善的读取余量。从8 MB BJT选择的PCM示范器中收集了实验结果。通过分别通过传统的设置框和设定扫描程序脉冲比较整个阵列在整个阵列上获得的小区分布来证明所提出的程序脉冲的有效性。

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