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Fault Equivalence and Diagnostic Test Generation Using ATPG

机译:使用ATPG的故障等价和诊断测试生成

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Fault equivalence is an essential concept in digital design with significance in fault diagnosis, diagnostic test generation, testability analysis and logic synthesis. In this paper, an efficient algorithm to check whether two faults are equivalent is presented. If they are not equivalent, the algorithm returns a test vector that distinguishes them. The proposed approach is complete since for every pair of faults it either proves equivalence or it returns a distinguishing vector. This is performed with a simple hardware construction and a sequence of simulation/ATPG-based steps. Experiments on benchmark circuits demonstrate the competitiveness of the proposed method.
机译:故障等价是数字设计中的重要概念,具有故障诊断,诊断试验,可测试性分析和逻辑合成的重要性。在本文中,提出了一种检查两个故障是否等同的有效算法。如果它们不等同,则该算法返回一个区分它们的测试矢量。所提出的方法是完整的,因为对于每对故障来说,它可以证明等价,或者返回一个区分的向量。这是通过简单的硬件构造和基于仿真/ ATPG的步骤进行的。基准电路上的实验表明了该方法的竞争力。

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