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Process design and profile analysis of dual-curvature with dual-focus of microlens array

机译:微透镜阵列双焦度双曲率的工艺设计与剖面分析

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This study aims to investigate the morphology of a dual-curvature with dual-focus microlens array by two different lithography processes. First, a diffuser lithography was used to fabricate the bottom of the lens. The result showed that the use of diffuser lithography increases the diameter of the bottom lens 20%. Then a copper layer was deposited on its surface, it is used for alignment in second lithography process. Second, the upper microlens was produced through second lithography process and followed by thermal reflow. The upper microlens formation was calculated by the volume transformation of the column into sphere in thermal reflow process. The pattern diameter of bottom mask had been designed to 100 and 120??m and the upper mask with pattern diameter were 75 and 90 ??m. The bottom microlens were fabricated in JSR-126N, a negative photoresist because of its high melting point when the upper layer fabrication would not affect the morphology of the bottom layer. Two pattern design dual-curvature microlens arrays are successfully produced using the proposed techniques. The related profiles are measured using a confocal laser scanning microscopy to verify their profiles.
机译:本研究旨在通过两种不同的光刻工艺研究双焦微透镜阵列双曲率的形态。首先,使用扩散器光刻来制造透镜的底部。结果表明,漫射光刻的使用增加了底部透镜20%的直径。然后将铜层沉积在其表面上,它用于在第二光刻过程中对准。其次,通过第二光刻工艺产生上微透镜,然后进行热回流。通过热回流过程中柱的体积转化来计算上微透镜形成。底部掩模的图案直径已经设计为100和120 ?? M,具有图案直径的上掩模为75和90Ω·m。当上层制造不会影响底层的形态时,在JSR-126N中,在JSR-126N中制造底部微透镜,为负光致抗蚀剂,因为其高熔点。使用所提出的技术成功生产两种模式设计双曲率微透镜阵列。使用共聚焦激光扫描显微镜测量相关的轮廓以验证其配置文件。

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