A Novel Pseudo-Random Scan Method for Silicon-Based Microdisplay

摘要

The continuous warming of the virtual reality (VR) display pushes the microdisplay to the high resolution and high refresh rate. However, the limited bandwidth of the microdisplay is difficult to carry the massive image data in the virtual world. In order to reduce the time redundancy, improve the transmission efficiency and solve the problem of low linearity in the imaging process, this paper introduces a novel pseudo-random scan method which is established on the traditional fractal scan model. And a silicon-based OLED microdisplay verification platform with a resolution of 1.6K*3*1.6K is built. The pseudorandom scan method achieves 100% transmission efficiency and 94.1% linearity, which is suitable for ultra-high definition and high-resolution microdisplays.