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ESA's CCD test bench for the Euclid visible channel

机译:ESA欧几里得可见光通道的CCD测试台

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The visual imaging instrument VIS on board Euclid baselines 36 newly designed CCD273-84 devices from e2v.While these new devices have a 4kx4k format with four readout nodes, the Euclid Imaging Consortium (EIC) hasperformed extensive test campaigns on both irradiated and un-irradiated devices of the 4kx1k Euclid precursor variantCCD204-22. In support of the CCD development and characterization, and to enable an independent assessment of theEuclid CCDs (the procurement of which is ESA’s responsibility), ESA/ESTEC has built a test bench. This test benchallows for a flexible operation and readout of the CCDs, originally for CCD204 and shortly also for CCD273-84. Itprovides the basic tools for noise and gain calibration, and CTI, QE, MTF and PRNU measurements. In addition, thebench provides scanning spot illumination with a spot size well below the pixel size, for measurement of the intra-pixelresponse of the CCDs before and after radiation damage. Such measurements are of great importance for thecharacterization and modeling of the VIS instrument’s PSF, in particular to enable the prediction of the evolution of thePSF shape under the influence of the L2 radiation environment during the mission. This set-up will also allow forsimulation of typical Euclid sky images in the lab. The capabilities and validation of this bench at ESA are described inthis paper.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:Euclid上的视觉成像仪器VIS基准了e2v的36款新设计的CCD273-84设备,尽管这些新设备具有4kx4k格式并带有四个读出节点,但Euclid Imaging Consortium(EIC)在辐照和未辐照下均进行了广泛的测试4kx1k Euclid前驱体CCD204-22的设备。为了支持CCD的开发和鉴定,并为了对Euuclid CCD进行独立评估(ESA负责采购),ESA / ESTEC建立了一个测试台。该测试平台允许灵活地操作和读取CCD,最初用于CCD204,不久也用于CCD273-84。它提供了用于噪声和增益校准以及CTI,QE,MTF和PRNU测量的基本工具。另外,该工作台提供的光斑尺寸远低于像素尺寸的扫描光斑照明,用于测量辐射损伤之前和之后CCD的像素内响应。这样的测量对于VIS仪器的PSF的表征和建模非常重要,特别是在执行任务期间,在L2辐射环境的影响下,能够预测PSF形状的演变。此设置还将允许模拟实验室中的典型Euclid天空图像。本文介绍了该平台在ESA上的功能和验证。©(2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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