Applying Fuzzy Image Processing Technology to Inspect Defects of Thin Film Transistor-Liquid Crystal Display

摘要

TFT-LCD cell process the grinding process, which can smoothen out the even edges of the TFT-glass substrate. In this processing, edges of the TFT-glass substrate easily fracture, which may damage the circuit of terminals. By using AOI to inspect the terminal, this study designs a fuzzy operator to separate the defect based on the arc curve that the detect features. By introducing the concept of image pyramid into the fuzzy operator, this study enables this fuzzy operator to be suitable for detecting defects, which are extremely small in size. Experimental results proved that the AOI for this study can accurately decide the grinding position of the TFT-glass substrate and simultaneously inspect terminals to ensure the terminal integrity.