Surface and micro-analytical methods for particle identification

摘要

The ultimate instrumental method for particle analysis should provide elemental composition, chemical bonding, and exact compound identification of organic, inorganic and metallic particles of any size and shape. Since this hypothetical method does not exist, scientists are forced to use a variety of techniques that accomplish a subset of these requirements. Surface analysis methods such as Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and X-ray Photoelectron Spectroscopy (XPS, also known as ESCA) fulfill many of the desired criteria while confining analysis to the outer surface of the particles. Micro-beam methods such as Energy Dispersive X-ray Spectroscopy (EDS), Micro-Fourier Transform Infrared Spectroscopy (micro-FT-IR) and Raman Spectroscopy fulfill many of the same criteria and can examine larger analytical volumes. The fundamental characteristics of these six methods will be discussed in light of the specific requirements and restrictions needed for particle analysis. Typical case studies from a variety of industries will be used to highlight the technique selection process.