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Inspection of Fabric Defects Based on Compactly Supported Biorthogonal Wavelet Transform

机译:基于紧凑型双正交小波变换的织物缺陷检查

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A method to inspect fabric defects based on compactly supported biorthogonal wavelet transform is presented. Firstly, the fabric images are captured by CCD camera. Then fabric defects are detected by means of the strategy of compactly supported biorthogonal wavelet transform. The phase shifts with the orthogonal and the biorthogonal wavelet techniques are compared aiming at the warp-lacking. It is shown that the phase shifts of orthogonal wavelet behave as different degrees, the ones of biorthogonal wavelet are zero. Finally, employing the biorthogonal wavelet method to inspect fabric defects, including warplacking, weft-lacking, oil stains, and holes, is given by experiments, in which the results are satisfied.
机译:提出了一种基于紧凑型的双正交小波变换检查织物缺陷的方法。首先,通过CCD相机捕获织物图像。然后通过紧凑型的双正态小波变换策略来检测织物缺陷。将与正交和双正交小波技术的相移瞄准缺乏正交和双正交小波技术。结果表明,正交小波的相位偏移表现为不同程度,双正交小波中的零。最后,采用双正常小波法检查织物缺陷,包括试验,缺乏缺乏,油污渍和孔,在其满足结果中。

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