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Inspection of Fabric Defects Based on Compactly Supported Biorthogonal Wavelet Transform

机译:基于紧支撑双正交小波变换的织物疵点检测

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A method to inspect fabric defects based on compactly supported biorthogonal wavelet transform is presented. Firstly, the fabric images are captured by CCD camera. Then fabric defects are detected by means of the strategy of compactly supported biorthogonal wavelet transform. The phase shifts with the orthogonal and the biorthogonal wavelet techniques are compared aiming at the warp-lacking. It is shown that the phase shifts of orthogonal wavelet behave as different degrees, the ones of biorthogonal wavelet are zero. Finally, employing the biorthogonal wavelet method to inspect fabric defects, including warplacking, weft-lacking, oil stains, and holes, is given by experiments, in which the results are satisfied.
机译:提出了一种基于紧支撑双正交小波变换的织物疵点检测方法。首先,织物图像由CCD相机捕获。然后借助紧密支持的双正交小波变换策略检测织物缺陷。针对无翘曲,比较了正交和双正交小波技术的相移。结果表明,正交小波的相移表现为不同程度,双正交小波的相移为零。最后,采用双正交小波方法对织物缺陷进行了检查,包括经纱,纬纱,油渍和孔洞,结果令人满意。

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