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Increase in resistivity of indium-tin-oxide films spin-coated on titanium-dioxides

机译:在二氧化钛上旋涂的铟锡氧化物薄膜的电阻率增加

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摘要

ITO and TiO2 films were prepared on silicon substrate using spin-coating method. Three types of samples were prepared for comparison. They were ITO/TiO2(78nm-thick)/Si, ITO/TiO2(25nm-thick)/Si and ITO/Si. The resistivity of an ITO film prepared on TiO2 was larger than that on Si. Furthermore, the resistivity became larger with increasing the thickness of the underlying TiO2 layer.
机译:采用旋涂法在硅衬底上制备了ITO和TiO 2 薄膜。准备了三种类型的样品进行比较。它们是ITO / TiO 2 (78nm厚)/ Si,ITO / TiO 2 (25nm厚)/ Si和ITO / Si。在TiO 2 上制备的ITO膜的电阻率大于在Si上的电阻率。此外,电阻率随着下面的TiO 2 层厚度的增加而变大。

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