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Flexible zinc oxide thin-film transistors using oxide buffer layers on polyethylene napthalate substrates

机译:在聚乙烯萘甲酸酯衬底上使用氧化物缓冲层的柔性氧化锌薄膜晶体管

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We report on the fabrication and characterization of flexible ZnO thin-film transistors (TFTs) using multilayer oxide buffer layers. ZnO-TFTs on polyethylene napthalate (PEN) substrates were fabricated by pulsed laser deposition (PLD) at room temperature (RT). ZnO films were characterized by Hall effect measurements. The electron mobility and the carrier density were 52.4 cm2/Vs and 3.2×1017 cm−3. Top-gate-type TFTs were fabricated from a thin film of HfO2 dielectric as a high-k material gate insulator. A transconductance, gm, of 1.7 mS/mm, an on/off-current ratio of 2.4×106 and a threshold voltage, Vth, of −1.2 V were achieved for a ZnO TFT with a SiO2/TiO2 buffer layer.
机译:我们报告了使用多层氧化物缓冲层的柔性ZnO薄膜晶体管(TFT)的制造和表征。通过在室温(RT)下进行脉冲激光沉积(PLD)来制备聚萘二甲酸乙二醇酯(PEN)基板上的ZnO-TFT。 ZnO薄膜通过霍尔效应测量进行表征。电子迁移率和载流子密度分别为52.4 cm 2 / Vs和3.2×10 17 cm -3 。顶栅型TFT由HfO 2 电介质薄膜作为高k材料栅绝缘体制成。跨导g m 为1.7 mS / mm,开/关电流比为2.4×10 6 ,阈值电压为V th 2 / TiO 2 缓冲层的ZnO TFT,可获得-1.2 V的inf>。

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