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Improved accuracy thermal nanostructure

机译:精度更高的热纳米结构

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A new high precision superior-order curvature-corrected integrated nanostructure will be presented. In order to improve the temperature behavior of the circuit, a double differential structure will be used, implementing the linear and the superior-order curvature corrections. An original CTAT (Complementary To Absolute Temperature) voltage generator will be proposed, using exclusively MOS transistors biased in weak inversion for a low power operation of the integrated nanostructure, having two great advantages: an important reducing of the circuit silicon area and an improved accuracy (matched resistors being replaced by matched MOS active devices). The superior-order curvature-correction will be implemented by taking the difference between two gate-source voltages of subthreshold-operated MOS transistors, biased at drain currents having different temperature dependencies: PTAT (Proportional To Absolute Temperature) and PTAT2. The SPICE simulations confirm the theoretical estimated results, showing a temperature coefficient under 11ppm / K for an extended input range 223K
机译:将提出一种新的高精度上级曲率校正的集成纳米结构。为了改善电路的温度特性,将使用双差分结构,实现线性和上阶曲率校正。将提出一种原始的CTAT(相对于绝对温度)电压发生器,该电压发生器仅使用在弱反转中偏置的MOS晶体管来实现集成纳米结构的低功耗运行,它具有两个很大的优点:大大减少了电路硅面积并提高了精度(匹配的电阻器被匹配的MOS有源器件取代)。高阶曲率校正将通过考虑亚阈值操作的MOS晶体管的两个栅极-源极电压之间的差来实现,该差值在具有不同温度依赖性的漏极电流下偏置:PTAT(与绝对温度成比例)和PTAT 2 < / sup>。 SPICE仿真证实了理论上的估计结果,显示出对于扩展输入范围223K

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