This paper examines the temperature dependence of mismatching and harmonic distortion properties in nanoscale uniaxial strained pMOSFETs. Our results reveal that the temperature dependence of drain current mismatch as well as harmonics distortion can be modulated by uniaxial strain. In the high gate-voltage overdrive (|Vgst|) linear region, the compressively-strained device shows smaller increment in drain current mismatch than the unstrained counterpart as temperature decreases. In the high |Vgst| saturation region, opposite to the unstrained case, the drain current mismatch of the compressively-strained device decreases with temperature. The underlying mechanism is the larger temperature sensitivity of carrier mobility for the strained device. The larger temperature sensitivity of carrier mobility may also results in larger temperature sensitivity of the harmonic distortion amplitudes. Our study may provide insights for analog circuit design using advanced strained devices.
展开▼
机译:本文研究了纳米级单轴应变pMOSFET中失配和谐波失真特性的温度依赖性。我们的结果表明,漏电流失配的温度依赖性以及谐波畸变可以通过单轴应变来调节。在高栅极电压过驱动(| V gst inf> |)线性区域中,随着温度降低,压应变器件的漏电流失配增量要比未应变器件的漏电流失配增量小。在| V gst inf> |中与未应变情况相反,在饱和区,压应变器件的漏极电流失配随温度降低。潜在的机制是应变器件对载流子迁移率的更大温度敏感性。载流子迁移率的较大温度敏感性也可能导致谐波失真幅度的较大温度敏感性。我们的研究可能会为使用高级应变器件的模拟电路设计提供见解。
展开▼