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Pattern deformation caused by deformed pellicle with ArF exposure

机译:暴露在ArF中的薄膜变形导致的图案变形

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It will directly affects pellicle degradation, at the irradiated part of the pellicle, and make a sloped pellicle surface and will act like a prism before change of phase or transmittance occurs, because the energies of C, F and O single bondings composing the ArF pellicle film is quite smaller than the energy of 193 nm ArF. Thus, outgoing light has information of smaller space than mask size. In order to offer some tip to find the appearance of pellicle thinning caused defect, several types of pattern deformation caused by pellicle degradation is studied.
机译:由于构成ArF防护膜的C,F和O单键的能量,它将直接影响防护膜在辐照膜部分的降解,并形成倾斜的防护膜表面,并在相变或透射率发生变化之前像棱镜一样起作用。薄膜比193 nm ArF的能量小得多。因此,出射光具有比掩模尺寸小的空间信息。为了提供一些提示以发现由防护膜变薄引起的缺陷的外观,研究了由防护膜退化引起的几种类型的图案变形。

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