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Differential- and common-mode characterization of coupled interconnect transmission lines using four-port S-parameter measurements

机译:使用四端口S参数测量耦合互连传输线的差分和共模特性

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In this paper, the differential- and common-mode characteristics of coupled interconnect transmission lines are presented using four-port scattering parameter (S-parameter) measurements for a section of coupled line, a series resistor and a shunt resistor, where the impedances of the resistors need not to know. Firstly, the differential- and common-mode propagation constants are solved by the determining equations consisted of three measured differential/common mode transmission matrixes, in which the transition and parasitic effects between the coaxial connectors and the coupled lines can be removed. With the low conductance loss condition for the substrate, the differential/common mode characteristic impedances can be further determined by the propagation constants and the unit-length capacitances which are measured by the dc resistance and low frequency reflection data of the series/shunt test key. The measured results for the coupled microstrip lines on FR-4 substrates are shown from 40 MHz to 8.5 GHz with comparisons of the other measurement method.
机译:在本文中,使用耦合端口的一部分,串联电阻和并联电阻的四端口散射参数(S参数)测量结果,介绍了耦合互连传输线的差分和共模特性。电阻器不需要知道。首先,通过由三个测得的差分/共模传输矩阵组成的确定方程式求解差分和共模传播常数,可以消除同轴连接器和耦合线之间的过渡效应和寄生效应。在基板的电导损耗条件较低的情况下,可以通过传播常数和单位长度电容进一步确定差模/共模特性阻抗,该传播常数和单位长度电容由串联/并联测试键的直流电阻和低频反射数据测得。 FR-4基板上耦合的微带线的测量结果显示为40 MHz至8.5 GHz,并与其他测量方法进行了比较。

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