首页> 外文会议>2010 5th International Microsystems Packaging Assembly and Circuits Technology Conference >A study of measurement methodologies for the loss characteristics of laminates and the effects of laminate features on loss-reduction for high frequency circuit applications
【24h】

A study of measurement methodologies for the loss characteristics of laminates and the effects of laminate features on loss-reduction for high frequency circuit applications

机译:层压电路损耗特性的测量方法研究以及层压电路特性对高频电路应用中的损耗降低的影响

获取原文

摘要

The prediction of dielectric loss for laminate materials in high frequency applications has become more important as clock speed increases. But down the supply chain, laminators, board fabricators, ODM and OEM design houses utilize different technique to measure the dielectric constant and loss tangent of materials. This paper studies three measurement techniques: parallel plate, transmission line, and resonant cavity; and attempts to find a suitable measurement method as standard. In addition, this paper also addresses some key factors that can influence the loss characteristics of laminates Through design modification, we can reach the goal of reducing total loss of materials and keeping cost down for high frequency applications
机译:随着时钟速度的提高,对层压材料在高频应用中的介电损耗的预测变得越来越重要。但是在供应链中,覆膜机,电路板制造商,ODM和OEM设计公司采用了不同的技术来测量材料的介电常数和损耗角正切。本文研究了三种测量技术:平行板,传输线和谐振腔。并尝试找到合适的测量方法作为标准。此外,本文还探讨了一些可能影响层压板损耗特性的关键因素。通过设计修改,我们可以达到减少材料总损耗和降低高频应用成本的目标。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号