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Several issues on the designment of pulse electrical stress aging test device of insulation materials

机译:绝缘材料脉冲电应力老化试验装置的几个问题

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In order to meet the requirements of the lifespan test of insulating materials under pulsed electrical stress circumstances, a high-voltage high-frequency pulse power supply device of cascaded H-bridge with optical isolation was developed. After studing the pulse parameters with specimen, we should consider the pulse rise time in load condition but not overemphasize the pulse rise time in no-load condition when designing the experimental device. The methods to estimate pulse rise time of multi-mode cascaded H-bridge and pulse power capacity were proposed through analyzing. The experimental result shows that the method which uses to estimate the pulse rise time and power capacity is correct, and technical solutions proposed meets the needs of the accelerated aging test of insulating material under pulsed electrical stress circumstances insulation pulse electrical stress need.
机译:为了满足脉冲电力应力下绝缘材料的寿命试验的要求,开发了一种具有光学隔离的级联H桥的高压高频脉冲电源装置。在使用样本进行脉冲参数之后,我们应该考虑负载条件的脉冲上升时间,但在设计实验装置时,在无负载条件下不透明脉冲上升时间。通过分析提出了估计多模级联H桥和脉冲功率容量的脉冲上升时间的方法。实验结果表明,用于估计脉冲上升时间和功率容量的方法是正确的,并且提出的技术方案满足脉冲电应力情况下绝缘脉冲电力应力下绝缘材料加速老化试验的需要。

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