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Designing parameters for RF MOS cells

机译:RF MOS单元的设计参数

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摘要

Demand of radio frequency switches using Metal-Oxide-Semiconductor (MOS) technology at high-frequencies for wireless telecommunication system is increasing drastically. This paper presents the results for the development of a cell library that includes the basics of the design parameters for n-MOS transistor and p-MOS transistor to design a RF CMOS switch. The cell library design includes the properties for RF circuit design standard and measurement outcomes are presented. The cell parameters presented here are calculated (designed) using 2.0 μm and 0.8 μm technology MOS integrated circuit. In this paper we discussed and found better result in terms of drain current for gate voltage of 2.1 V compare to 1.2 V, calculate the power for these voltages and time constant with help of contact resistance and capacitances.
机译:对于无线电信系统,在高频下使用金属氧化物半导体(MOS)技术的射频开关的需求急剧增加。本文介绍了一个单元库的开发结果,该单元库包括用于设计RF CMOS开关的n-MOS晶体管和p-M​​OS晶体管设计参数的基础。单元库设计包括RF电路设计标准的属性,并介绍了测量结果。此处介绍的单元参数是使用2.0μm和0.8μm技术的MOS集成电路计算(设计)的。在本文中,我们讨论并发现了2.1 V的栅极电压与1.2 V的栅极电流相比,漏极电流更好的结果,并借助接触电阻和电容来计算这些电压的功率和时间常数。

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