首页> 外文会议>2010 IEEE AUTOTESTCON >Programming approach with parallel capable instruments for test efficiency
【24h】

Programming approach with parallel capable instruments for test efficiency

机译:使用具有并行功能的仪器的编程方法以提高测试效率

获取原文

摘要

Throughput demands and cost-down pressures involved with modern functional testing necessitate a trend towards a parallel test paradigm. Parallel test techniques can be employed by test engineers to overcome these challenges. The benefits of conducting tests on multiple units/subsystems concurrently are to maximize instrumentation utilization, increase throughput and reduce execution time. This paper will outline a strategy for implementing parallel tests and provide some practical program development guidance and techniques which will allow test program developers to take full advantage of parallel capable systems.
机译:随着现代功能测试所涉及的吞吐量需求和降低成本的压力,必然会朝着并行测试范式发展。测试工程师可以采用并行测试技术来克服这些挑战。同时在多个单元/子系统上进行测试的好处是最大程度地提高了仪器利用率,增加了吞吐量并减少了执行时间。本文将概述实现并行测试的策略,并提供一些实用的程序开发指南和技术,这些方法和技术将使测试程序开发人员能够充分利用并行功能的系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号