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30 Years of HgCdTe Technology in Israel

机译:HgCdTe技术在以色列的30年历史

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The study of HgCdTe technology in Israel began in the mid 1970's under the leadership of the late Prof. Kidron and his group at the Technion, Israel Institute of Technology. The R&D efforts were continued by other groups at the Technion and other universities and research institutes in Israel, as well as by SCD. Many aspects of the technology of this material were studied, including both bulk crystal and epitaxial growths and microelectronic fabrication methods, with an emphasis on surface treatment and passivation. Various characterization methods were developed to study both the basic and applied material and device properties. The efforts, reviewed in this article, matured at SCD as it commercialized the HgCdTe technology, launching large-volume production lines of state-of-the-art linear and multi-linear TDI LWIR detector arrays of various sizes from 10×1 to 480×6 elements. Over the years, SCD has supplied its customers with thousands of both photoconductive (PC) and photovoltaic (PV) detectors, which are briefly presented in the paper.
机译:以色列对HgCdTe技术的研究始于1970年代中期,在已故的Kidron教授及其在以色列理工学院Technion的研究小组的领导下。 Technion的其他团队以及以色列的其他大学和研究所以及SCD继续进行研发工作。研究了这种材料技术的许多方面,包括块状晶体和外延生长以及微电子制造方法,重点是表面处理和钝化。开发了各种表征方法来研究基本和应用的材料及器件特性。本文回顾的工作在SCD上已经成熟,因为它使HgCdTe技术商业化,启动了大批量生产各种尺寸从10×1到480的最新线性和多线性TDI LWIR检测器阵列的生产线×6个元素。多年来,SCD已为其客户提供了数千种光电导(PC)和光电(PV)检测器,本文对此进行了简要介绍。

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