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Mercury Cadmium Telluride Infrared detector development in India: Status and issues

机译:汞碲化镉红外线探测器开发在印度:地位和问题

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In the present paper, we describe the development of Long Wave Infrared (8.12 μm) linear and 2-D IR FPA detectors using HgCdTe for use in thermal imagers and IIR seekers. In this direction, Solid State Physics Laboratory(SSPL) (DRDO) tried to concentrate initially in the bulk growth and characterization of HgCdTe during the early eighties. Some efforts were then made to develop a LWIR photoconductive type MCT array in linear configuration with the IRFPA processed on bulk MCT crystals grown in the laboratory. Non availability of quality epilayers with the required specification followed by the denial of supply of CdTe, CdZnTe and even high purity Te by advanced countries, forced us to shift our efforts during early nineties towards development of 60 element PC IR detectors. High performance linear PC arrays were developed. A novel horizontal casting procedure was evolved for growing high quality bulk material using solid state recrystallization technique. Efforts for ultra purification of Te to 7N purity with the help of a sister concern has made it possible to have this material indigenously. Having succeded in the technology for growing single crystalline CdZnTe with (111) orientation and LPE growth of HgCdTe epilayers on CdZnTe substrates an attempt was made to establish the fabrication of 2D short PV arrays showing significant IR response. Thus a detailed technological knowhow for passivation, metallization, ion implanted junction formation, etc. was generated. Parallel work on the development of a matching CCD Mux readout in silicon by Semiconductor Complex Limited was also completed which was tested first in stand-alone mode followed by integration with IRFPAs through indigenously-developed indium bumps. These devices were integrated into an indigenously fabricated glass dewar cooled by a self-developed JT minicooler. In recent years, the LPE (Liquid Phase Epitaxy) growth from Te-rich route has been standardized for producing epitaxial layers with high compositional and thickness uniformity leading to a respectable stage of maturity in FPA technology.
机译:在本论文中,我们描述了长波红外(8.12微米)的线性和使用碲镉汞用于热成像仪和IIR者使用2-d IR FPA检测器的发展。在这个方向上,固态物理实验室(SSPL)(DRDO)试图在碲镉汞的整体生长和表征在八十年代初开始集中。然后一些已作出努力,以发展线性结构的LWIR光导型MCT阵列上在实验室中生长的本体MCT晶体处理的IRFPA。质量外延层与所需规格的非有效性,然后碲化镉,碲锌镉甚至高纯碲的供应先进国家的拒绝,迫使我们在朝着60元PC红外探测器的发展九十年代初,以我们的努力转移。高性能线性阵列PC开发了。一种新型的水平铸造过程放出用于使用固态重结晶技术生长高品质的散装材料。对于以7N纯度与妹妹关心的帮助特超净化努力使之有可能有这种材料本土。具有succeded在技术用于生长单晶的CdZnTe用的HgCdTe外延层上的CdZnTe(111)取向和LPE生长衬底有人企图建立2D短光伏阵列表示显著IR响应的制造。由此产生钝化,金属化,离子注入结形成等中详述一个技术知识。在匹配CCD复用的并行发展的工作中硅读出由半导体复合有限公司也完成了其在单机模式,然后通过本土研发的铟柱红外焦平面集成第一次测试。这些装置被整合到由自发达JT minicooler冷却的本国制造玻璃杜瓦瓶。近年来,从富Te路线LPE(液相外延)的增长已经标准化生产外延层具有高成分和厚度的均匀性,导致成熟的FPA技术可敬的阶段。

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