首页> 外文会议>International symposium on photoelectronic detection and imaging;ISPDI 2009 >Ultrafast carrier dynamics and terahertz conductivity of photoexcited GaAs under electric field
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Ultrafast carrier dynamics and terahertz conductivity of photoexcited GaAs under electric field

机译:电场作用下光激发GaAs的超快载流子动力学和太赫兹电导率

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Ultrafast carrier dynamics in semiconductors has attracted much attention due to the application in high speed devices. Compared to the conventional experimental techniques, such as the time-resolved optical transmission technique and the all-optical pump-probe spectroscopy, the optical pump-terahertz probe spectroscopy has a plethora of advantages to provide the ability to temporally resolve phenomena at the fundamental timescales of carrier motion. The distinct advantage of OPTP is being able to directly measure the photo-induced changes in the photoconductivity, which contains the information of carrier density and mobility, with a temporal resolution of sub-picosecond. The ultrafast carrier dynamics and transient terahertz photoconductivity in semi-insulating GaAs have been investigated under electric field by using optical pump-terahertz probe technique with an unchanged pump power irradiating on the GaAs surface. One-dimensional pump scan at the maximum value of the THz pulse under electric fields of 0 kV/cm, 6 kV/cm, and 15 kV/cm, respectively. The measurements indicate that the terahertz transmission change induced by the pump pulses at high electric field is smaller than that without electric field. It is obvious that the threshold value of E, which begins to enhance the transmission, is about 3-4 kV/cm. We attribute this phenomenon to carrier scattering into the L valley or even X valley, which leads to a drop in carrier mobilities due to the large effective masses in those satellite valleys. The calculated transient photoconductivities fit well with the Drude-Smith model, which attributes the negative imaginary conductivity to the backward scattering of electrons. The negative value of cl in our fitting implies that a fraction, but not all, of the backward scattering is a result of the electron reflecting from surfaces. It could also result from a Coulombic scattering between carriers. Due to the low mobilities of electrons in the L valley, the average mobility of all electrons will decrease under high E. These fitting results are consistent with our intervalley scattering model. Our investigation suggests that the OPTP technique is a very promising method for detecting the ultrafast dynamics in those materials.
机译:由于在高速设备中的应用,半导体中的超快载流子动力学已引起了广泛的关注。与传统的实验技术(例如时间分辨光传输技术和全光泵浦探针光谱法)相比,光泵太赫兹探针光谱法具有许多优势,可以在基本时标上暂时解析现象载体运动。 OPTP的独特优势是能够直接测量光导率中的光诱导变化,其中包含载流子密度和迁移率的信息,时间分辨率为亚皮秒。在电场作用下,利用光泵激-太赫兹探针技术,在GaAs表面辐照了不变的泵浦功率的情况下,研究了半绝缘GaAs中的超快载流子动力学和瞬态太赫兹光电导性。一维泵浦分别在0 kV / cm,6 kV / cm和15 kV / cm的电场下以THz脉冲的最大值进行扫描。测量表明,在高电场下由泵浦脉冲引起的太赫兹传输变化要小于没有电场时的太赫兹传输变化。显然,开始增强传输的E阈值约为3-4 kV / cm。我们将此现象归因于载流子散射到L谷甚至X谷中,由于这些卫星谷中的有效质量较大,导致载流子迁移率下降。计算出的瞬态光电导率与Drude-Smith模型非常吻合,该模型将负虚构电导率归因于电子的向后散射。在我们的拟合中,cl的负值表示向后散射的一部分(但不是全部)是电子从表面反射的结果。这也可能是由载体之间的库仑散射引起的。由于L谷中电子的迁移率较低,因此在高E下所有电子的平均迁移率将降低。这些拟合结果与我们的intervalley散射模型一致。我们的研究表明,OPTP技术是检测这些材料中超快动力学的非常有前途的方法。

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