Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique

摘要

The specific approach to characterizing the train-average parameters of low-power picosecond optical pulses with the frequency chirp, arranged in high-repetition-frequency trains, in both time and frequency domains is elaborated for the important case when semiconductor heterolasers operate in the active mode-locking regime. This approach involves the joint Wigner time-frequency distributions, which can be created for those pulses due to exploitation of a novel interferometric technique under discussion. Practically, the InGaAsP/InP-heterolasers generating at the wavelength 1320 nm were used during the experiments carried out and an opportunity of reconstructing the corresponding joint Wigner time-frequency distributions was successfully demonstrated.