Research of Interconnect Network Test Based on Boundary Scan

摘要

Along with the fast development of electric circuit technology, the percentage of the stuck-at-logic fault, Wire-logic fault and Strong-driver-logic fault are rising in the complex PCB, and the testability of PCB becomes more and more difficult. Test technique of interconnect network based on boundary scan is an advanced test and testability design technology in solving these problems. This technology offers an integrated and standard test method for interconnect network test of VLSI. Through analyzing fault module, a design of interconnect network test system is presented based on boundary scan, then a new kind of algorithm of interconnect diagnosis is used to verify it. Experimental results prove that this test system is feasible, efficient and exact.