Study on Interconnect Test with Multiple Scan Chains Based on VXIbus Boundary Scan Module

摘要

The use of multiple scan chains for interconnect test is analyzed. Based on the researches on greedy strategy for configuring multiple scan chains for internal test and the sorting algorithm of single scan chain for Cluster test, solution of configuring and optimizing multiple scan chains for interconnect test is presented. It will aim to decrease the test time and increase the efficiency and reliability for interconnect test significantly. Experiment results show that the expected design objective is achieved.