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Negative refractive index in ferromagnetic semiconductors: experimental verification

机译:铁磁半导体的负折射率:实验验证

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In this work, we show that natural crystals, or magnetic semiconductor, Cr-doped indium oxide, has anegative refractive index at ~ 27.8 micron wavelength. The effect was predicted by two of us a few yearsago (A.G. Kussow and A. Akyurtlu, Phys. Rev. B, 78, 205202 (2008)). Our result seriously undermineswide-spread opinion that only composite artificial metamaterials can demonstrate negative refractive index.Thin ferromagnetic films of ICO were fabricated by original post-annealing sputtering method. FTIR R andT measurements were processed to extract refractive index within the range of interest. The extracted fromcombined transmittance and reflectance FTIR data negative refractive index band parameters are found tobe close to expected one.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:在这项工作中,我们表明,天然晶体或磁性半导体,Cr掺杂氧化铟,具有约27.8微米波长的折射率。我们的两个人预测了几个历史(A.G.Kussow和A. Akyurtlu,Phys。Rev. B,78,205202(2008))。我们的结果严重破坏了拓展的综合性意见,即只有复合人工超材料可以证明负折射率。这是ICO的铁磁性薄膜由原始退火溅射法制造。加工FTIR R ANDT测量以提取感兴趣范围内的折射率。发现从Combined透射率和反射率为FTIR数据负折射率参数接近预期的透射率参数。©(2012)照片光学仪表工程师(SPIE)的版权协会。仅供个人使用的摘要下载。

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