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Improving Quantum Efficiency and Spectral Resolution of a CCD through Direct Manipulation of the Depletion Region

机译:通过直接控制耗尽区来提高CCD的量子效率和光谱分辨率

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Future generations of X-ray astronomy instruments will require position sensitive detectors in the form of charge-coupled devices (CCDs) for X-ray spectroscopy and imaging with the ability to probe the X-ray universe with greater efficiency. This will require the development of CCDs with structures that will improve their quantum efficiency over the current state of the art. The quantum efficiency improvements would have to span a broad energy range (0.2 keV to >15 keV). These devices will also have to be designed to withstand the harsh radiation environments associated with orbits that extend beyond the Earth's magnetosphere. This study outlines the most recent work carried out at the University of Leicester focused on improving the quantum efficiency of an X-ray sensitive CCD through direct manipulation of the device depletion region. It is also shown that increased spectral resolution is achieved using this method due to a decrease in the number of multi-pixel events. A Monte Carlo and analytical models of the CCD have been developed and used to determine the depletion depths achieved through variation of the device substrate voltage, Vss. The models are also used to investigate multi-pixel event distributions and quantum efficiency as a function of depletion depth.
机译:下一代X射线天文仪器将需要采用电荷耦合器件(CCD)形式的位置敏感探测器,以用于X射线光谱学和成像,并具有更高效率探测X射线宇宙的能力。这将需要开发具有将在当前的现有技术水平上提高其量子效率的结构的CCD。量子效率的提高将必须跨越广泛的能量范围(0.2 keV至> 15 keV)。这些设备还必须设计成能够承受与延伸到地球磁层以外的轨道相关的恶劣辐射环境。这项研究概述了在莱斯特大学进行的最新工作,该工作致力于通过直接操纵器件耗尽区来提高X射线敏感CCD的量子效率。还表明,由于减少了多像素事件的数量,因此使用此方法可以获得更高的光谱分辨率。已经开发了蒙特卡洛(Monte Carlo)和CCD的分析模型,并用于确定通过器件衬底电压Vss的变化实现的耗尽深度。这些模型还用于研究多像素事件分布和量子效率与耗尽深度的关系。

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