There is an interest in identifying localised effects when investigating durability of devices. The combination of tests might also have an influence on test results. This is investigated for single junction amorphous silicon modules. The modules were put under accelerated testing including thermal cycling, light soaking and annealing test. I-V measurement and LBIC system as characterisation tools are used to investigate the possible degradation occurring in the devices both before and after certain stages of the test. Results have shown that there is a difference between modules which have experienced light soaking before being exposed to thermal cycling, indicating that the initial light soaking resulted in a UV activation of the material, which then changed the durability of the lamination.
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