首页> 外文会议>Conference of the Australian Society of Sugar Cane Technologists >MEASUREMENT OF CRYSTAL SIZE SPREAD THROUGH THE HIGH GRADE PAN STAGE FOR AN INDONESIAN AND AN AUSTRALIAN FACTORY
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MEASUREMENT OF CRYSTAL SIZE SPREAD THROUGH THE HIGH GRADE PAN STAGE FOR AN INDONESIAN AND AN AUSTRALIAN FACTORY

机译:印度尼西亚和澳大利亚工厂通过高阶锅台测量的晶体尺寸

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Growth rate dispersion (GRD) has long been observed in industrial sugar vacuum pan operation and is a principal cause in broadening crystal size distributions. This is the phenomenon where seeds with an initially narrow size distribution spread their size distribution because each sugar crystal grows at a different rate. These rate differences are maintained as crystals grow towards shipment size. There is a special case of GRD termed common history (CH) crystals, where the crystal size is proportional to its relative growth rate. As CH crystals grow, the shape of the size distribution on a log size scale is unchanged. Also dimensionless measures of spread, such as the coefficient of variation (CV), are constant. The CV of material in the high grade pan stage in Gunung Madu Plantation (GMP) sugar factory, Indonesia, which produces plantation white sugar, has been measured. The seed materials were prepared in high grade graining, without washing, using the dissolved intermediate products (B sugar and C sugar). A similar measurement also has been carried out at the Broadwater sugar mill that adopts the classical three massecuite boiling formula, in which C sugar is prepared into magma and serves as footing material for A and B strikes. Shipment sugar is made from the mixture of A sugar and B sugar. The results showed that high grade sugars behave as common history crystals. Within the accuracy of sampling and sizing, the crystal size distributions as the crystals grow appeared to be of identical shape on a log size basis, demonstrating the size distribution reflects the growth rate distribution. This occurred in graining as well as in growth pans. Furthermore, the coefficient of variation (CV) values remained constant throughout the boiling process.
机译:长期以来,在工业制糖真空锅操作中已观察到生长速度分散(GRD),这是导致晶体尺寸分布变宽的主要原因。这是一种现象,因为每个糖晶体以不同的速度生长,因此最初具有狭窄尺寸分布的种子会分散其尺寸分布。随着晶体向装运尺寸的增长,这些速率差异得以维持。有一种称为通用历史(CH)晶体的GRD特例,其中晶体尺寸与其相对生长速率成正比。随着CH晶体的生长,对数尺寸标度上的尺寸分布形状不变。扩展系数的无量纲度量(例如变异系数(CV))也是恒定的。已测量了印度尼西亚Gunung Madu种植园(GMP)制糖厂生产高档白糖的高级锅阶段材料的CV。使用溶解的中间产物(B糖和C糖),无需清洗即可将种子材料制成高级谷物。在Broadwater制糖厂也采用了类似的测量方法,该糖厂采用了经典的三块糖沸腾配方,其中C糖被制成岩浆,并用作A和B走向的立足材料。装运糖是由A糖和B糖的混合物制成的。结果表明,高级糖具有常见的历史晶体的作用。在采样和定尺寸的精度范围内,随着晶体的生长,晶体的尺寸分布似乎以对数尺寸为基础具有相同的形状,这表明尺寸分布反映了生长速率的分布。这发生在谷物和生长盘中。此外,在整个沸腾过程中,变异系数(CV)值保持恒定。

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