首页> 外文会议>Conference of the Australian Society of Sugar Cane Technologists >MEASUREMENT OF CRYSTAL SIZE SPREAD THROUGH THE HIGH GRADE PAN STAGE FOR AN INDONESIAN AND AN AUSTRALIAN FACTORY
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MEASUREMENT OF CRYSTAL SIZE SPREAD THROUGH THE HIGH GRADE PAN STAGE FOR AN INDONESIAN AND AN AUSTRALIAN FACTORY

机译:测量晶体尺寸通过高档平底锅阶段为印度尼西亚和澳大利亚工厂提供

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GROWTH rate dispersion (GRD) has long been observed in industrial sugar vacuum pan operation and is a principal cause in broadening crystal size distributions. This is the phenomenon where seeds with an initially narrow size distribution spread theirsize distribution because each sugar crystal grows at a different rate. These rate differences are maintained as crystals grow towards shipment size. There is a special case of GRD termed common history (CH) crystals, where the crystal size is proportional to its relative growth rate. As CH crystals grow, the shape of the size distribution on a log size scale is unchanged. Also dimensionless measures of spread, such as the coefficient of variation (CV), are constant. The CV of material in the high gradepan stage in Gunung Madu Plantation (GMP) sugar factory, Indonesia, which produces plantation white sugar, has been measured. The seed materials were prepared in high grade graining, without washing, using the dissolved intermediate products (B sugar and C sugar). A similar measurement also has been carried out at the Broadwater sugar mill that adopts the classical three massecuite boiling formula, in which C sugar is prepared into magma and serves as footing material for A and B strikes. Shipment sugar is made from the mixture of A sugar and B sugar. The results showed that high grade sugars behave as common history crystals. Within the accuracy of sampling and sizing, the crystal size distributions as the crystals grow appeared to be of identical shape on a log size basis, demonstrating the size distribution reflects the growth rate distribution. This occurred in graining as well as in growth pans. Furthermore, the coefficient of variation (CV) values remained constant throughout the boiling process.
机译:在工业糖真空盘操作中长期观察到生长速率分散(GRD),是展大晶体尺寸分布的主要原因。这是具有初始窄尺寸分布的种子的种子扩散了贯穿件分布,因为每个糖晶体以不同的速率增长。随着晶体生长在装运大小的情况下,这些速率差异保持。有一个特殊的GRD称为常见历史(CH)晶体,其中晶体尺寸与其相对生长速率成比例。随着CH晶体生长,数尺度尺度上的尺寸分布的形状不变。也是散布的无量纲测量,例如变异系数(CV)是恒定的。已经测量了Gunung Madu Plantation(GMP)糖厂,印度尼西亚的糖厂中的高毕业生阶段的CV,从而产生了种植园白糖。使用溶解的中间产物(B糖和C糖),在高等级晶体中制备种子材料,无需洗涤。在宽阔的糖磨机中也进行了类似的测量,其采用经典的三种Masterecuite沸石配方,其中C糖准备到岩浆中,并用作A和B击球的基础材料。装运糖由糖和B糖的混合物制成。结果表明,高级糖表现为常见的历史晶体。在采样和施胶的精度内,晶体尺寸分布在晶体中似乎在数量的基础上出现相同的形状,证明尺寸分布反映了生长速率分布。这发生在谷物和生长平底锅中。此外,在整个沸腾过程中,变异系数(CV)值仍然是恒定的。

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