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SILICON HETERO JUNCTION SOLAR CELLS BY HOT-WIRE CVD

机译:热线化学气相沉积硅异质结太阳能电池

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We are reporting high performance silicon heterojuncton (SHJ) solar cells fabricated using the hot-wire chemical vapor deposition (HWCVD) technique. On p-type c-Si float-zone wafers, we used an amorphous n/i contact to the top surface and an i/p contact to the back surface to obtain an open circuit voltage (Voc) of 0.67 V in a 1 cm2 cell with an independent confirmed efficiency of 18.2%. This is the best reported p-type SHJ solar cell, at least by HWCVD. On n-type c-Si float-zone wafers, we used an amorphous (p/i) front emitter and an a-Si:H (i) back contact to achieve a Voc of 0.69 V on 1 cm2 cell. We found that proper c-Si surface cleaning prior to the amorphous Si deposition and double-heterojunction is a key to the high Voc. In the heterojunction region, an abrupt interface from c-Si to a-Si:H results in a high Voc; while incorporating a transition to either microcrystalline or epitaxial Si at the c-Si interface results in a low Voc. Lifetime measurement shows that the back surface recombination velocity can be reduced to ~15 cm/s through a-Si:H passivation. Amorphous silicon heterojunction layers on crystalline wafers thus combine low-surface recombination velocity with excellent carrier extraction. The advantages of using HWCVD in comparing with plasma-enhanced CVD are the fast deposition rate and, more important, a wide range of deposition parameters enabling formation of an effective heterojunction with high Voc. Further, the heterojuction cell processing is entirely below 200°C making it one of the few promising low-stress methods for the manufacturing of next generation ultra-thin Si wafer solar cells.
机译:我们正在报告使用热线化学气相沉积(HWCVD)技术制造的高性能硅异质结(SHJ)太阳能电池。在p型c-Si浮区晶片上,我们使用与顶面的非晶n / i接触和与背面的i / p接触,以在1 cm2中获得0.67 V的开路电压(Voc)。独立确认的效率为18.2%。至少通过HWCVD,这是报道最多的p型SHJ太阳能电池。在n型c-Si浮区晶片上,我们使用了非晶(p / i)前发射极和a-Si:H(i / n)背接触,以在1 cm2的电池上实现0.69 V的Voc。我们发现,在非晶硅沉积和双异质结之前适当的c-Si表面清洁是高Voc的关键。在异质结区域,从c-Si到a-Si:H的突然界面导致高Voc;当在c-Si界面上结合向微晶或外延Si过渡时,会降低Voc。终生测量表明,通过a-Si:H钝化可以将背面复合速度降低到〜15 cm / s。因此,晶体晶片上的非晶硅异质结层将低表面复合速度与出色的载流子提取率结合在一起。与等离子增强CVD相比,使用HWCVD的优势在于沉积速度快,更重要的是,广泛的沉积参数可形成具有高Voc的有效异质结。此外,异质结电池工艺完全低于200°C,使其成为制造下一代超薄Si晶片太阳能电池的少数有前途的低应力方法之一。

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