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ESTABLISHING STRONG CONTROL OF FAMILYWISE ERROR RATE FOR ITERATIVE STEP-DOWN TESTS

机译:为迭代降压测试建立严格的家庭错误率控制

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A long-standing problem concerning the iterative analysis of orthogonal saturated designs has been resolved. Consider an unreplicated factorial design yielding independent, normally distributed estimators of k parameters but no independent variance estimator. Many authors have proposed iterative step-down tests for the analysis of such designs. In essence, the first such methods were proposed by Birnbaum [3] and Daniel [4]. It is well known that iterative methods are more powerful than corresponding closed step-down tests (see Voss [12]), and so the iterative tests are more popular. This popularity has grown despite lack of a proof that the iterative methods strongly control the family-wise error rate, while some corresponding closed step-down tests with modestly less power have been known to provide such control. Venter and Steele [11] claimed that certain iterative step-down tests strongly control error rates, but they failed to provide a proof. Recently Holm, Mark and Adolfsson [5] provided the first iterative step-down test for analysis of orthogonal saturated designs shown to strongly control the familywise error rate. Using the same technical approach, but without the need for explicit consideration of coverage bounds, we establish strong control of the familywise error rate for a large class of iterative step-down tests, including the iterative tests of Zahn [19, 20] and Ventor and Steel [11], iterative variations on the tests of Daniel [4], Birnbaum [3], Voss [12], Voss and Wang [14], Lenth [8] and Ye, Hamada and Wu [18], and a generalization of the Holm, Mark and Adolfsson [5] test for orthogonal saturated designs. Also included are the iterative step-down tests of Langsrud and Naes [6] for nearly saturated designs. Since our approach does not explicitly involve coverage bounds, implementation is relatively simple. Also, the normality assumption can be relaxed.
机译:解决了关于正交饱和设计的迭代分析的一个长期存在的问题。考虑一个不重复的阶乘设计,它产生k个参数的独立的,正态分布的估计量,但没有独立的方差估计量。许多作者提出了迭代降压测试来分析此类设计。本质上,最早的此类方法是Birnbaum [3]和Daniel [4]提出的。众所周知,迭代方法比相应的封闭式降压测试更强大(请参见Voss [12]),因此迭代测试更受欢迎。尽管没有证据表明迭代方法可以强烈地控制族错误率,但是这种流行程度已经增长,而已知一些相应的封闭式降压测试却以较小的功率提供了这种控制。 Venter和Steele [11]声称某些迭代式降压测试可以强有力地控制错误率,但是他们未能提供证明。最近,Holm,Mark和Adolfsson [5]提供了第一个迭代的降压测试,用于分析正交饱和设计,该设计可以强烈地控制家族误差率。使用相同的技术方法,但无需明确考虑覆盖范围,我们为大型迭代降压测试(包括Zahn [19,20]和Ventor的迭代测试)建立了对家庭错误率的强大控制。和Steel [11],Daniel [4],Birnbaum [3],Voss [12],Voss和Wang [14],Lenth [8]以及Ye,Hamada和Wu [18]的测试的迭代变化。正交饱和设计的Holm,Mark和Adolfsson [5]检验的一般化。还包括针对几乎饱和设计的Langsrud和Naes [6]的迭代降压测试。由于我们的方法未明确涉及覆盖范围,因此实现相对简单。同样,可以放宽正态性假设。

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