A Survey of Reliability Modeling Methodologies for Digital Instrumentation and Control Systems

摘要

A survey of the literature indicates that while severaltechniques have been proposed to develop reliabilitymodels for the DCIS, all techniques have difficultiesregarding the incorporation of the resulting model into anexisting PRA (see Table 1). It is also not clear that theinteraction of the DCIS hardware, software and theprocess that is being controlled can be represented by anysingle technique properly. Computational effort requiredis another issue that needs to be addressed. Work is inprogress to identify combinations of techniques that canovercome these challenges.