Multiple errors produced by single upsets in FPGA configuration memory: a possible solution

摘要

The very high integration levels reached by SRAM-based field programmable gate arrays (FPGAs) lead to high occurrence rate of single event upsets (SEUs) in their configuration memory, which can produce multiple errors affecting routing resources. Based on detailed analysis of this phenomenon, we devised a reliability-oriented place and route algorithm able to significantly improve the reliability of SRAM-based FPGAs with limited costs in terms of performance degradation and resource occupation. To evaluate the effectiveness of the algorithm we performed extensive fault injection experiments.