首页> 外文会议>Electronics and the Environment, 2005. Proceedings of the 2005 IEEE International Symposium on >Handheld x-ray fluorescence: practical application as a screening tool to detect the presence of environmentally-sensitive substances in electronic equipment
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Handheld x-ray fluorescence: practical application as a screening tool to detect the presence of environmentally-sensitive substances in electronic equipment

机译:手持式X射线荧光:用作检测电子设备中是否存在环境敏感物质的筛选工具的实际应用

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As the implementation deadlines approach, the electronics industry is focusing significant efforts on compliance with the restriction of hazardous substances (RoHS) directive and the waste electrical and electrical equipment (WEEE) directive. The intent of the EU RoHS Directive (2002/95/EC) is to restrict the use of six substances (lead, mercury, cadmium, hexavalent chromium, PBBs and certain PBDEs) in certain electronic products. There are a number of methods that companies are employing to validate restricted substance compliance within the supply chain, including analytical testing. Normative test methods are needed for the industry to determine the concentrations of the regulated substances in electronic products. This paper presents the practical application of a handheld x-ray fluorescence (XRF) analyzer to estimate the concentration levels of restricted elements such as lead (Pb) and cadmium (Cd) in electronic components. Through this study, handheld XRF was determined to be a suitable screening tool to estimate the concentration of regulated substances in electronic components with some limitations. Being quick and easy-to-use, XRF has shown to be a useful tool for conducting in-house screening analyses of components to reduce testing time and costs.
机译:随着实施截止日期的临近,电子行业正在集中精力致力于遵守有害物质限制(RoHS)指令和废弃电气电子设备(WEEE)指令。欧盟RoHS指令(2002/95 / EC)的目的是限制在某些电子产品中使用六种物质(铅,汞,镉,六价铬,多溴联苯和某些多溴二苯醚)。公司采用多种方法来验证供应链中受限物质的合规性,包括分析测试。业界需要使用规范的测试方法来确定电子产品中受管制物质的浓度。本文介绍了手持式X射线荧光(XRF)分析仪的实际应用,以估算电子元件中受限元素(例如铅(Pb)和镉(Cd))的浓度水平。通过这项研究,手持式XRF被确定为评估电子元件中受限制物质浓度的合适筛选工具,但存在一些局限性。 XRF快速且易于使用,已证明是进行内部组件筛选分析以减少测试时间和成本的有用工具。

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