Embedded Test Resource to Reduce the Required Memory and Channels of Tester

摘要

An embedded test stimulus decompressor is presented to generate the test patterns, which can reduce the required vector memory and channels of automatic test equipment(ATE). The decompressor consists of a periodically alterable MUX network which has multiple configurations to decode the input information flexibly. A complete synthesis flow is presented to generate the MUXs network automatically. With the dedicated efforts, the low-cost ATE with low data bandwidth can be used to test the system-on-a-chip with high complexity.