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On-chip detection and counting of single-photons

机译:片内检测和单光子计数

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摘要

We present a fully-integrated CMOS implementation of a sensor chip that contains a single-photon avalanche diode (SPAD), the driving active quenching circuit (AQC) for operating the detector above breakdown, and the digital counting and transmission electronics for remote control and data uploading via a remote computer. The technology is a standard double metal, single-poly 0.8mum-CMOS process. The on-chip photodetector is operated from 2V to 10V above breakdown, in order to detect single photons. After each ignition, the chip quenches and resets the detector with fast transitions of few nanoseconds and holds it off for an adjustable time duration from 5ns to 1 mus. Measurement time slots are generated on-chip and are adjustable in the 3mus-40ms range. Both free-running and gated-detector operation are provided. The achievable photon counting rate is 30Mphoton/s
机译:我们介绍了一种传感器芯片的完全集成的CMOS实现,该传感器芯片包括单光子雪崩二极管(SPAD),驱动有源淬火电路(AQC),用于操作上方的检测器,以及用于遥控器的数字计数和传输电子设备和数据通过远程计算机上传。该技术是标准双金属,单多元0.8mum-CMOS工艺。片上光电探测器以2V至10V的击穿,以检测单个光子。每次点火后,芯片淬火并重置检测器,快速过渡几个纳秒,并将其关闭可调节时间持续时间从5ns到1毫秒。在片上产生测量时隙,可在3MUS-40ms范围内调节。提供自由运行和门控探测器操作。可实现的光子计数率为30mphoton / s

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