首页> 外文会议>Radiation Effects Data Workshop, 2004 >Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs

【24h】

Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs

机译：Xilinx一次性可编程配置PROM的重离子SEE测试

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

We compare the results of single event effects in two sizes and grades of programmable read-only-memories (PROMs) in the Xilinx 17xx device family. The main failure modes include address upsets, end-of-part failures, and a low-power standby mode requiring a power cycle to recover.

机译：我们比较了Xilinx 17xx器件系列中两种大小和等级的可编程只读存储器（PROM）的单事件效果的结果。主要故障模式包括地址异常，部分故障和需要重启电源才能恢复的低功耗待机模式。

著录项

来源
《Radiation Effects Data Workshop, 2004 》|2004年|p.72-78|共7页
会议地点
作者
George J.; Swift G.; Guertin S.; Carmichael C.; Rezgui S.; Koga R.;
展开▼
作者单位

展开▼
会议组织
原文格式 PDF
正文语种
中图分类无线电电子学、电信技术 ;
关键词
PROM; ion beam effects; integrated circuit testing; integrated circuit reliability; heavy ion beams; heavy ion SEE testing; one-time programmable configuration PROM; single event effects; programmable read-only-memories; failure modes; address upsets; end-of-part failures; low-power standby mode; power cycle reset;

机译：PROM;离子束效应;集成电路测试;集成电路可靠性;重离子束;重离子SEE测试;一次性可编程配置PROM;单事件效应;可编程只读存储器;故障模式;地址翻转;终止部件故障;低功耗待机模式;重启电源;

相似文献

外文文献
中文文献
专利

1. Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions [J] . Vlagkoulis Vasileios, Sari Aitzan, Vrachnis John, IEEE Transactions on Nuclear Science . 2021 ,第1期

机译：单一事件效应Xilinx Zynq-7000 FPGA的可编程逻辑使用非常/超高能量的重离子
2. An approach to minimize the test configuration for the logic cells of the XILINX XC4000 FPGAs family [J] . M. Renovell, J. M. Portal, J. Figueras, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2000 ,第3期

机译：最小化XILINX XC4000 FPGA系列逻辑单元的测试配置的方法
3. An approach to minimize the test configuration for the logic cells of the XILINX XC4000 FPGAs family [J] . M. Renovell, J. M. Portal, J. Figueras, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2000 ,第3期

机译：最小化XILINX XC4000 FPGA系列逻辑单元的测试配置的方法
4. Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs [C] . George J., Swift G., Guertin S., IEEE Radiation Effects Data Workshop . 2004

机译：重离子查看Xilinx一次性可编程配置PROM的测试
5. A computer-aided testing framework for field programmable gate arrays: From verification to configuration. [D] . Chen, Xiaotao. 1997

机译：用于现场可编程门阵列的计算机辅助测试框架：从验证到配置。
6. Development and Preliminary Testing of a Promotora- Delivered Spanish Language Counseling Intervention for Heavy Drinking among Male Latino Day Laborers [O] . Alison A. Moore, Mitchell P. Karno, Lara Ray, -1

机译：开发和初步测试以西班牙语为母语的拉丁裔临时工为重度饮酒提供辅导的西班牙语
7. Analysis of the reconfiguration latency and energy overheads for a Xilinx Virtex‐5 field‐programmable gate array [O] . Javier Olivito, Felipe Serrano, Juan Antonio Clemente, 2018

机译：Xilinx Virtex-5现场可编程门阵列的重新配置延迟和能量开销分析
8. SEE and TID extension testing of the Xilinx XQR18V04 4Mbit radiation hardened configuration PROM [R] . Yui, C., Swift, G., Fabula, J., 2002

机译：Xilinx XQR18V04 4mbit辐射硬化配置pROm的sEE和TID扩展测试

Heavy ion SEE testing of Xilinx one-time programmable configuration PROMs

摘要

著录项

相似文献

相关主题

期刊订阅