Minimal March tests for unlinked static faults in random access memories

机译：对随机存取存储器中未链接的静态故障进行最少的March测试

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New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).

机译：提出了新的最小三月测试算法，用于检测随机存取存储器中的（所有）未链接的静态故障。特别是，引入了一种新的最小复杂度为I8N的March March MSS测试，以检测所有现实的简单静态故障，例如March SS（22N）（S。Hamdioui，van de Goor，Rodgers，MTDT 2002）。

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《Intelligent Sensors, Sensor Networks and Information Processing Conference, 2004. Proceedings of the 2004》|2005年|p.53-59|共7页
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Harutunvan; G.; Vardanian; V.A.; Zorian; Y.;
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中图分类无线电电子学、电信技术;
关键词
fault diagnosis; random-access storage; integrated circuit testing; unlinked static faults; random access memories; minimal March test algorithms; unlinked static fault detection; minimal March MSS test;

机译：故障诊断;随机访问存储;集成电路测试;未链接的静态故障;随机访问存储器;最小March测试算法;未链接的静态故障检测;最小March March MSS测试;

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1. March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories [J] . Cascaval P., Cascaval D. Microelectronics journal . 2019,第Nova期

机译：随机存取存储器中非链接静态减少的三单元耦合故障的三月测试算法
2. Minimal March Tests for Detection of Dynamic Faults in Random Access Memories [J] . G. HARUTUNYAN, V. A. VARDANIAN, Y. ZORIAN, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2007,第1期

机译：用于检测随机存取存储器中动态故障的最小March测试
3. Minimal March Tests for Detection of Dynamic Faults in Random Access Memories [J] . G. Harutunyan, V. A. Vardanian, Y. Zorian Journal of Electronic Testing . 2007,第1期

机译：用于检测随机存取存储器中动态故障的最小March测试
4. Minimal March tests for unlinked static faults in random access memories [C] . Harutunvan G., Vardanian V.A., Zorian Y. IEEE VLSI Test Symposium . 2005

机译：在随机访问存储器中的未链接静态故障最小的3月测试
5. Fault models and tests for coupling faults in random-access memories. [D] . Cockburn, Bruce Fordyce. 1990

机译：故障模型和随机存取存储器中耦合故障的测试。
6. Electrical Coupling and Simulation of Monolithic 3D Logic Circuits and Static Random Access Memory [O] . Tae Jun Ahn, Bum Ho Choi, Sung Kyu Lim, 2019

机译：整体式3D逻辑电路和静态随机存取存储器的电耦合和仿真
7. March AB, March AB1: new March tests for unlinked dynamic memory faults [O] . Benso, Alfredo, Bosio, Alberto, Di Carlo, Stefano, 2005

机译：3月AB，3月AB1：针对未链接的动态内存故障的新3月测试
8. Random Access Memory Testing: Theory and Practice. The Gains of Fault Modeling [R] . Veenstra, P. K. 1986

机译：随机存取存储器测试：理论与实践。故障建模的收益

Minimal March tests for unlinked static faults in random access memories

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