The critical need for open ATE architecture

摘要

The open architecture for ATE systems approach provides a powerful framework for the development and utilization of IC test solutions that meet critical time to market, functionality, and cost effectiveness requirements. The proliferation of design for testability and built-in-self test is fundamentally changing the nature of IC test and creating opportunities for new approaches to deploying testing solutions. These conditions coupled with the financial and technical realities of semiconductor industry call for a new approach.